• (주)테크라인코리아

  • 경기 용인시 기흥구 중부대로 184, A동 1803호 (기흥힉스유타워)
  • 대표 : 김태수
  • EMAIL : sjlee@techline.co.kr
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    (주)테크라인코리아
    All RIGHTS RESERVED.

분석 서비스

FIB 분석 및 회로수정

FIB를 이용한 Circuit(회로) 복원 및 FIB 분석은 칩설계에 필요한 중요한 기술서비스 입니다.

▶ 분석 문의/의뢰 : sjlee@techline.co.kr

 

고객이 필요로 하는 다양한 FIB 서비스를 제공합니다.

 

 

 

Precision Cutting

TEM Sample Preparation

IC Circuit Editing and Verification

Abnormal Process Analysis

Ion Channeling Contrast for Grain Morphology Observation

Auto-Navigation to Designated Failure Address

Passive Voltage Contrast Analysis for Fault Isolation

 

 

- (a) FIB circuit repair

- (b) Sn Whisker cutting

- (c) Cross-section observation of Pb-Sn Solder

- (d) Cross-section observation of a sample

 

 

- (a) Cross-section observation of a sample

- (b) FIB IC circuit repair

- (c) Cross-section observation under a solder ball

- (d) IC abnormality observation

 

 

- (a) Grain analysis/observation

- (b) Cross-section observation

- (c) FIB IC circuit repair

- (d) Cross-section observation of a PCB board

 

 

- (a) Probing pad

- (b) Big-area cross-section observation;

- (c) Cross-section observation after FIB circuit repair