FIB를 이용한 Circuit(회로) 복원 및 FIB 분석은 칩설계에 필요한 중요한 기술서비스 입니다.
▶ 분석 문의/의뢰 : sjlee@techline.co.kr
고객이 필요로 하는 다양한 FIB 서비스를 제공합니다.
Precision Cutting
TEM Sample Preparation
IC Circuit Editing and Verification
Abnormal Process Analysis
Ion Channeling Contrast for Grain Morphology Observation
Auto-Navigation to Designated Failure Address
Passive Voltage Contrast Analysis for Fault Isolation
- (a) FIB circuit repair
- (b) Sn Whisker cutting
- (c) Cross-section observation of Pb-Sn Solder
- (d) Cross-section observation of a sample
- (a) Cross-section observation of a sample
- (b) FIB IC circuit repair
- (c) Cross-section observation under a solder ball
- (d) IC abnormality observation
- (a) Grain analysis/observation
- (b) Cross-section observation
- (c) FIB IC circuit repair
- (d) Cross-section observation of a PCB board
- (a) Probing pad
- (b) Big-area cross-section observation;
- (c) Cross-section observation after FIB circuit repair