• (주)테크라인코리아

  • 경기 용인시 기흥구 중부대로 184 (영덕동, 힉스유타워 지식산업센터) A동 813호
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  • TEL : 070-7778-5814
  • EMAIL : tskim@tekline.co.kr
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    (주)테크라인코리아
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분석 서비스

FIB 분석 및 Circuit 복원

FIB를 이용한 Circuit(회로) 복원 및 FIB 분석은 칩설계에 필요한 중요한 기술서비스 입니다.

 

고객이 필요로 하는 다양한 FIB 서비스를 제공합니다.

 

 

Precision Cutting

TEM Sample Preparation

IC Circuit Editing and Verification

Abnormal Process Analysis

Ion Channeling Contrast for Grain Morphology Observation

Auto-Navigation to Designated Failure Address

Passive Voltage Contrast Analysis for Fault Isolation

 

 

- (a) FIB circuit repair

- (b) Sn Whisker cutting

- (c) Cross-section observation of Pb-Sn Solder

- (d) Cross-section observation of a sample

 

 

- (a) Cross-section observation of a sample

- (b) FIB IC circuit repair

- (c) Cross-section observation under a solder ball

- (d) IC abnormality observation

 

 

- (a) Grain analysis/observation

- (b) Cross-section observation

- (c) FIB IC circuit repair

- (d) Cross-section observation of a PCB board

 

 

- (a) Probing pad

- (b) Big-area cross-section observation;

- (c) Cross-section observation after FIB circuit repair